Joe Armstrong
at Polytec GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 March 2020 Paper
Proc. SPIE. 11287, Photonic Instrumentation Engineering VII
KEYWORDS: Polishing, Metrology, Interferometers, Manufacturing, Optical coatings, Optical testing, 3D metrology, Tolerancing, Optics manufacturing, Surface finishing

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