Dr. Joe Armstrong
Application Scientist at Taylor Hobson Ltd
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | April 27, 2006
Proc. SPIE. 6188, Optical Micro- and Nanometrology in Microsystems Technology
KEYWORDS: Confocal microscopy, Microscopes, Light sources, Metrology, Interferometers, Sensors, Interferometry, Phase interferometry, Objectives, Optical interferometry

PROCEEDINGS ARTICLE | August 19, 2005
Proc. SPIE. 5872, Advancements in Polymer Optics Design, Fabrication, and Materials
KEYWORDS: Diamond turning, Diamond, Metrology, Diamond machining, Visualization, Interferometry, Platinum, Signal processing, 3D metrology, Correlation function

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top