Dr. Joël Gest
at Univ du Littoral Côte d'Opale
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 25 May 2004 Paper
Gerard Leroy, Joel Gest, Lode Vandamme, Jean-Claude Carru, Annick F. Degardin, Alain Kreisler
Proceedings Volume 5469, (2004) https://doi.org/10.1117/12.546726
KEYWORDS: Superconductors, Resistance, Annealing, Thin films, Temperature metrology, Metals, Interference (communication), Thin film deposition, Microwave radiation, Crystals

Proceedings Article | 25 May 2004 Paper
Gerard Leroy, Joel Gest, Lode Vandamme, Olivier Bourgeois
Proceedings Volume 5469, (2004) https://doi.org/10.1117/12.546507
KEYWORDS: Sapphire, Thin films, Resistors, Resistance, Thin film deposition, Semiconductors, Temperature metrology, Silicon, Nitrogen, Sensors

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