Dr. Joël Gest
at Univ du Littoral Côte d'Opale
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5469, Fluctuations and Noise in Materials
KEYWORDS: Semiconductors, Thin films, Sensors, Silicon, Nitrogen, Resistance, Sapphire, Resistors, Thin film deposition, Temperature metrology

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5469, Fluctuations and Noise in Materials
KEYWORDS: Thin films, Metals, Annealing, Crystals, Resistance, Superconductors, Interference (communication), Microwave radiation, Thin film deposition, Temperature metrology

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