Prof. Joel Moser
at Soochow Univ.
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 6 November 2023 Paper
Proceedings Volume 12921, 1292116 (2023) https://doi.org/10.1117/12.2688193
KEYWORDS: Graphene, Resonators, Mode shapes, Finite element methods, Electrodes, Sensors, 3D modeling, Vibration, Signal processing, Roentgenium

Proceedings Article | 23 January 2023 Paper
Proceedings Volume 12556, 1255602 (2023) https://doi.org/10.1117/12.2642575
KEYWORDS: Graphene, Resonators, Silicon, Ions, Gallium, Ion beam lithography, Electrodes, Oxides, Nanolithography, Ion beams

Proceedings Article | 23 January 2023 Paper
Proceedings Volume 12556, 1255603 (2023) https://doi.org/10.1117/12.2642576
KEYWORDS: Resonators, Graphene, Reflectivity, Photodetectors, Electrodes, Silicon, Ion beam lithography, Nanolithography, Lithography, Dielectrics

Proceedings Article | 4 December 2020 Paper
Ye Tian, Chen Yang, Heng Lu, Fengnan Chen, Fanqi Xu, Jun Lu, Youlong Xian, Wei Song, Ying Yan, Joel Moser
Proceedings Volume 11617, 1161732 (2020) https://doi.org/10.1117/12.2585423

Proceedings Article | 5 November 2020 Paper
Jun Lu, Heng Lu, Antoine Reserbat-Plantey, Chen Yang, Ye Tian, Ying Yan, Joel Moser
Proceedings Volume 11562, 1156205 (2020) https://doi.org/10.1117/12.2574614
KEYWORDS: Silicon, Gold, Actuators, Optical testing, Reflectivity, Objectives, Gaussian beams

Showing 5 of 8 publications
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