Mr. Johan Holm
Development Engineer at Chemometec A/S
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 31, 2005
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Diffraction, Data modeling, Sensors, Microscopy, Optical microscopy, Atomic force microscopy, Scanning electron microscopy, System on a chip, Americium, Diffraction gratings

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