Prof. Johan H. Stiens
ETRO-LAMI Professor at Vrije Univ Brussel
SPIE Involvement:
Author
Publications (27)

PROCEEDINGS ARTICLE | April 28, 2012
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Diffraction, Metrology, Reflectivity, Carbon dioxide lasers, Nondestructive evaluation, Infrared spectroscopy, Scatterometry, Neodymium, Semiconducting wafers, Diffraction gratings

PROCEEDINGS ARTICLE | May 13, 2010
Proc. SPIE. 7716, Micro-Optics 2010
KEYWORDS: Infrared imaging, Silica, Interfaces, Silicon, Photography, Infrared radiation, Microwave radiation, Semiconducting wafers, Wafer bonding, Plasma

PROCEEDINGS ARTICLE | April 29, 2010
Proc. SPIE. 7711, Metamaterials V
KEYWORDS: Metamaterials, Resonators, Scattering, Metals, Copper, Dielectrics, Terahertz radiation, Split ring resonators, Tolerancing, FSS based metamaterials

PROCEEDINGS ARTICLE | April 29, 2010
Proc. SPIE. 7711, Metamaterials V
KEYWORDS: Refractive index, Resonators, Sensors, Quartz, Metals, Skin, Silicon, Capacitance, Aluminum, Split ring resonators

PROCEEDINGS ARTICLE | February 26, 2010
Proc. SPIE. 7597, Physics and Simulation of Optoelectronic Devices XVIII
KEYWORDS: Diffraction, Quantum wells, Modulation, Dielectrics, Electrons, Doping, Modulators, Diffraction gratings, Amplitude modulation, Absorption

PROCEEDINGS ARTICLE | February 26, 2010
Proc. SPIE. 7597, Physics and Simulation of Optoelectronic Devices XVIII
KEYWORDS: Thermography, Sensors, Gallium arsenide, Diffusion, Carbon dioxide lasers, Numerical simulations, Finite element methods, Thermal modeling, Temperature metrology, Absorption

Showing 5 of 27 publications
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