Mr. Johann Krauter
at Institut für Technische Optik
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Microelectromechanical systems, Packaging, Wafer-level optics, Confocal microscopy, Short wave infrared radiation, Safety, Silica, Interferometers, Sensors, Inspection, Interferometry, Optical testing, Optical inspection, Optical metrology, Semiconducting wafers

PROCEEDINGS ARTICLE | April 27, 2016
Proc. SPIE. 9888, Micro-Optics 2016
KEYWORDS: Optical components, Polishing, Glasses, Micro optics, Microlens, Optical aberrations, Semiconducting wafers

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Mirrors, Beam splitters, Microsystems, Optical coherence tomography, Skin, Silicon, Microopto electromechanical systems, Semiconducting wafers

PROCEEDINGS ARTICLE | September 1, 2015
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Optical imaging, Mirrors, Beam splitters, Light sources, Imaging systems, Cameras, Sensors, Optical coherence tomography, Signal processing, Objectives

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9529, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials II
KEYWORDS: Signal to noise ratio, Mirrors, Light sources, Phase shifting, Interferometers, Cameras, Optical coherence tomography, Skin cancer, Molybdenum, Phase shifts

PROCEEDINGS ARTICLE | May 1, 2014
Proc. SPIE. 9132, Optical Micro- and Nanometrology V
KEYWORDS: Optical design, Beam splitters, Imaging systems, Interferometers, Cameras, Sensors, Optical coherence tomography, Skin, Tissue optics, Electroluminescent displays

Showing 5 of 6 publications
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