Dr. Johann Krauter
Development Engineer at TRUMPF SE + Co KG
SPIE Involvement:
Publications (7)

Proceedings Article | 18 August 2018 Paper
Proceedings Volume 10749, 1074911 (2018) https://doi.org/10.1117/12.2319575
KEYWORDS: Microelectromechanical systems, Semiconducting wafers, Silicon, Interferometry, Microscopes, Sensors, Infrared radiation, Interferometers, Refractive index, Inspection

Proceedings Article | 26 June 2017 Paper
Proceedings Volume 10329, 1032914 (2017) https://doi.org/10.1117/12.2269499
KEYWORDS: Semiconducting wafers, Safety, Packaging, Wafer-level optics, Interferometers, Microelectromechanical systems, Optical inspection, Sensors, Interferometry, Silica, Short wave infrared radiation, Optical metrology, Inspection, Optical testing, Confocal microscopy

Proceedings Article | 27 April 2016 Paper
Proceedings Volume 9888, 98880T (2016) https://doi.org/10.1117/12.2228833
KEYWORDS: Optical components, Polishing, Micro optics, Glasses, Optical aberrations, Semiconducting wafers, Microlens

Proceedings Article | 26 April 2016 Paper
Proceedings Volume 9890, 98900C (2016) https://doi.org/10.1117/12.2229477
KEYWORDS: Skin, Microopto electromechanical systems, Optical coherence tomography, Microsystems, Mirrors, Silicon, Semiconducting wafers, Beam splitters

Proceedings Article | 1 September 2015 Paper
Proceedings Volume 9576, 957609 (2015) https://doi.org/10.1117/12.2189885
KEYWORDS: Optical coherence tomography, Mirrors, Sensors, Light sources, Cameras, Imaging systems, Objectives, Signal processing, Optical imaging, Beam splitters

Showing 5 of 7 publications
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