Johannes E. Fröch
at Univ of Technology Sydney
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 December 2019
Proc. SPIE. 11201, SPIE Micro + Nano Materials, Devices, and Applications 2019
KEYWORDS: Second-harmonic generation, Spectroscopy, Microscopy, Atomic force microscopy, Nonlinear optics, Harmonic generation

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top