Johannes Kettel
at Univ Freiburg
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Microscopes, Mirrors, Optical sensors, 3D acquisition, Cameras, Microscopy, Optical microscopy, Optical microscopy, 3D modeling, Optical testing, Data acquisition, 3D metrology, Process control, Specular reflections, Digital micromirror devices, 3D scanning, 3D image processing, GPU based image processing, Structured light

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Confocal microscopy, Microscopes, Point spread functions, 3D acquisition, Optical testing, 3D metrology, Objectives, Charge-coupled devices, 3D image processing, Structured light

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top