Prof. Johannes Schwider
at Friedrich-Alexander Univ Erlangen-Nürnberg
SPIE Involvement:
Conference Program Committee | Author
Publications (77)

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Multimode fibers, Superposition, Optical filters, Light sources, Resonators, Interferometers, Interferometry, Frequency combs, Light, Fizeau interferometers

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Reflectors, Telescopes, Mirrors, Eye, Optical spheres, Interferometers, Interferometry, Solids, Spherical lenses, 3D vision

PROCEEDINGS ARTICLE | April 25, 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Optical fibers, Microscopes, Beam splitters, Microlens array, Interferometers, Surface roughness, Micro optics, Microlens, Source mask optimization, Spherical lenses

PROCEEDINGS ARTICLE | April 25, 2008
Proc. SPIE. 6994, Photon Management III
KEYWORDS: Optical components, Diffraction, Light sources, Roentgenium, Sensors, Free space, Wave propagation, Light wave propagation, Diffraction gratings, Shearing interferometers

PROCEEDINGS ARTICLE | June 18, 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Multimode fibers, Superposition, Microscopes, Light sources, Resonators, Interferometers, Interferometry, Frequency combs, Objectives, Fizeau interferometers

PROCEEDINGS ARTICLE | August 14, 2006
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Mirrors, Light sources, Optical spheres, Interferometers, Sensors, Laser scattering, Interferometry, Spatial coherence, Spherical lenses, Light

Showing 5 of 77 publications
Conference Committee Involvement (5)
Interferometry XIII: Techniques and Analysis
14 August 2006 | San Diego, California, United States
Optical Manufacturing and Testing VI
31 July 2005 | San Diego, California, United States
Interferometry XII: Techniques and Analysis
2 August 2004 | Denver, Colorado, United States
Optical Manufacturing and Testing V
3 August 2003 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection III
23 June 2003 | Munich, Germany
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top