Prof. Johannes Schwider
at Friedrich-Alexander Univ Erlangen-Nürnberg
SPIE Involvement:
Author
Publications (78)

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Diffraction, Beam splitters, Axicons, Interferometers, Interferometry, Wavefronts, Aspheric lenses, Grazing incidence, Spherical lenses, Visibility

Proceedings Article | 11 August 2008 Paper
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Multimode fibers, Superposition, Optical filters, Light sources, Resonators, Interferometers, Interferometry, Frequency combs, Light, Fizeau interferometers

Proceedings Article | 11 August 2008 Paper
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Reflectors, Telescopes, Mirrors, Eye, Optical spheres, Interferometers, Interferometry, Solids, Spherical lenses, 3D vision

Proceedings Article | 25 April 2008 Paper
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Optical fibers, Microscopes, Beam splitters, Microlens array, Interferometers, Surface roughness, Micro optics, Microlens, Source mask optimization, Spherical lenses

Proceedings Article | 25 April 2008 Paper
Proc. SPIE. 6994, Photon Management III
KEYWORDS: Optical components, Diffraction, Light sources, Roentgenium, Sensors, Free space, Wave propagation, Light wave propagation, Diffraction gratings, Shearing interferometers

Showing 5 of 78 publications
Conference Committee Involvement (5)
Interferometry XIII: Techniques and Analysis
14 August 2006 | San Diego, California, United States
Optical Manufacturing and Testing VI
31 July 2005 | San Diego, California, United States
Interferometry XII: Techniques and Analysis
2 August 2004 | Denver, Colorado, United States
Optical Manufacturing and Testing V
3 August 2003 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection III
23 June 2003 | Munich, Germany
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