Dr. John A. Adams
at JMAR Technologies Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 15 April 2008
Proc. SPIE. 6945, Optics and Photonics in Global Homeland Security IV
KEYWORDS: Homeland security, Contamination, Water, Particles, Light scattering, Microorganisms, Surveillance, Telecommunications, Pathogens, Bacteria

Proceedings Article | 19 May 2006
Proc. SPIE. 6218, Chemical and Biological Sensing VII
KEYWORDS: Scattering, Sensors, Water, Particles, Organisms, Light scattering, Laser scattering, Pathogens, Mie scattering, Bacteria

Proceedings Article | 24 March 2006
Proc. SPIE. 6152, Metrology, Inspection, and Process Control for Microlithography XX
KEYWORDS: Contamination, Silica, Scattering, Sensors, Water, Particles, Light scattering, Mie scattering, Semiconductor manufacturing, Bacteria

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