Prof. John E. Armstrong
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Zemax, Mirrors, X-ray optics, Lenses, Interferometry, Wavefront sensors, Wavefronts, Optical testing, LCDs, Optics manufacturing

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