Dr. John Aston
at US Census Bureau
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 13, 2003
Proc. SPIE. 5207, Wavelets: Applications in Signal and Image Processing X
KEYWORDS: Wavelet transforms, Statistical analysis, Data modeling, Wavelets, Error analysis, Image analysis, Neuroimaging, Algorithm development, Positron emission tomography, Functional magnetic resonance imaging

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