Mr. John P. Ciraldo
Technical Manager, Mobile Applications at J2 Materials
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | May 21, 2014
Proc. SPIE. 9100, Image Sensing Technologies: Materials, Devices, Systems, and Applications
KEYWORDS: Sensors, Etching, Crystals, X-rays, X-ray diffraction, Sapphire, Transmittance, X-ray detectors, Standards development, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | May 2, 2014
Proc. SPIE. 9127, Photonic Crystal Materials and Devices XI
KEYWORDS: Etching, Crystals, X-rays, X-ray diffraction, Photonic crystals, Sapphire, Transmittance, X-ray detectors, Standards development, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | June 4, 2013
Proc. SPIE. 8708, Window and Dome Technologies and Materials XIII
KEYWORDS: Thermography, Refractive index, Polishing, Crystals, X-rays, Resistance, Sapphire, Solids, Neodymium, Crystal optics

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