Dr. John David Cressler
at Georgia Institute of Technology
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8549, 16th International Workshop on Physics of Semiconductor Devices
KEYWORDS: Ions, Oxygen, Oxides, Silicon, Transistors, Heterojunctions, Sensors, Gamma radiation, Semiconductors, Physics

PROCEEDINGS ARTICLE | June 8, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Measurement devices, Temperature metrology, Silicon, Transparency, Oxides, Resistance, Transistors, Virtual colonoscopy, Analog electronics, Remote sensing

PROCEEDINGS ARTICLE | June 8, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Thin films, Doping, Temperature metrology, Resistance, Oxides, Thin film devices, Silicon, Interference (communication), Germanium, Interfaces

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Transistors, Oxides, Analog electronics, Temperature metrology, Resistance, Physics, Tolerancing, Signal detection, Ionizing radiation, Amplifiers

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Silicon, Transistors, Germanium, Doping, Oscillators, CMOS technology, Manufacturing, Interference (communication), Data modeling, Capacitance

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Virtual colonoscopy, Resistors, Microelectronics, Temperature metrology, Electrochemical etching, Spectrum analysis, Transistors, Iterated function systems, Silicon, Instrument modeling

Showing 5 of 6 publications
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