Dr. John David Cressler
at Georgia Institute of Technology
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8549, 16th International Workshop on Physics of Semiconductor Devices
KEYWORDS: Semiconductors, Oxides, Sensors, Ions, Silicon, Physics, Oxygen, Transistors, Gamma radiation, Heterojunctions

PROCEEDINGS ARTICLE | June 8, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Oxides, Transparency, Remote sensing, Silicon, Resistance, Measurement devices, Transistors, Analog electronics, Temperature metrology, Virtual colonoscopy

PROCEEDINGS ARTICLE | June 8, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Oxides, Thin films, Germanium, Interfaces, Silicon, Resistance, Interference (communication), Doping, Thin film devices, Temperature metrology

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Oxides, Ionizing radiation, Resistance, Physics, Amplifiers, Transistors, Analog electronics, Signal detection, Tolerancing, Temperature metrology

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Oscillators, Data modeling, Germanium, Silicon, Manufacturing, Interference (communication), Doping, Capacitance, Transistors, CMOS technology

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Spectrum analysis, Silicon, Microelectronics, Transistors, Resistors, Iterated function systems, Electrochemical etching, Temperature metrology, Instrument modeling, Virtual colonoscopy

Showing 5 of 6 publications
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