Prof. John M. Dell Profile

Prof. John M. Dell

Professor and Dean of Eng, Computing and Math at Univ of Western Australia

SPIE Involvement:

Conference Program Committee | Conference Chair | Author

Publications (50)

PROCEEDINGS ARTICLE | June 25, 2014

An optically resonant position read-out system for MEMS gas sensors

Proc. SPIE. 9083, Micro- and Nanotechnology Sensors, Systems, and Applications VI

KEYWORDS: Microelectromechanical systems, Gas sensors, Modulation, Waveguides, Sensors, Silicon, Interferometry, Optical resonators, Chemical analysis, Laser optics

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PROCEEDINGS ARTICLE | May 21, 2014

Recent developments towards low-cost MEMS spectrometers

Proc. SPIE. 9101, Next-Generation Spectroscopic Technologies VII

KEYWORDS: Microelectromechanical systems, Long wavelength infrared, Mid-IR, Optical filters, Refractive index, Mirrors, Germanium, Spectrometers, Silicon, Absorption

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PROCEEDINGS ARTICLE | December 7, 2013

Long-wavelength infrared Fabry-Perot etalon for multi-spectral thermal imaging

Proc. SPIE. 8923, Micro/Nano Materials, Devices, and Systems

KEYWORDS: Long wavelength infrared, Thermography, Optical filters, Refractive index, Mirrors, Fabry–Perot interferometers, Germanium, Silicon, Zinc, Tunable filters

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PROCEEDINGS ARTICLE | December 7, 2013

Targeted sacrificial layer etching for MEMS release using microfluidic channels

Proc. SPIE. 8923, Micro/Nano Materials, Devices, and Systems

KEYWORDS: Fabrication, Microelectromechanical systems, Microfluidics, Optical lithography, Etching, Silicon, Photoresist materials, Picosecond phenomena, Fluid dynamics, Standards development

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PROCEEDINGS ARTICLE | December 7, 2013

A versatile instrumentation system for MEMS-based device optical characterization

Proc. SPIE. 8923, Micro/Nano Materials, Devices, and Systems

KEYWORDS: Microelectromechanical systems, Thermography, Mirrors, Imaging systems, Sensors, Optical metrology, Transmittance, Spatial resolution, Monochromators, Signal detection

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PROCEEDINGS ARTICLE | May 17, 2013

Optical actuation of silicon cantilevers: modelling and experimental investigation

Proc. SPIE. 8763, Smart Sensors, Actuators, and MEMS VI

KEYWORDS: Thermography, Oscillators, Modulation, Silica, Silicon, Semiconductor lasers, Thermal effects, Optical simulations, Applied physics, Temperature metrology

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PROCEEDINGS ARTICLE | May 21, 2011

Recent advances in SWIR MEMS-based tunable Fabry-Pérot microspectrometers

Proc. SPIE. 8012, Infrared Technology and Applications XXXVII

KEYWORDS: Microelectromechanical systems, Infrared detectors, Actuators, Gold, Short wave infrared radiation, Optical filters, Mirrors, Germanium, Silicon, Infrared radiation

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PROCEEDINGS ARTICLE | May 21, 2011

Vertical transport in InAs/GaSb type-II strained layer superlattices for infrared focal plane array applications

Proc. SPIE. 8012, Infrared Technology and Applications XXXVII

KEYWORDS: Infrared detectors, Infrared sensors, Spectrum analysis, Mercury cadmium telluride, Sensors, Electrons, Magnetism, Infrared radiation, Superlattices, Laser sintering

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PROCEEDINGS ARTICLE | May 12, 2011

On the accuracy of decay constant measurement by swept-cavity heterodyne cavity ringdown spectroscopy

Proc. SPIE. 8032, Next-Generation Spectroscopic Technologies IV

KEYWORDS: Photodetectors, Mirrors, Beam splitters, Tunable lasers, Spectroscopy, Heterodyning, Signal processing, Optical resonators, Signal detection, Filtering (signal processing)

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PROCEEDINGS ARTICLE | September 23, 2010

Performance predictions for monolithic thin-film CdTe/Ge tandem solar cells

Proc. SPIE. 7750, Photonics North 2010

KEYWORDS: Thin films, Photovoltaics, Solar cells, Germanium, Electrons, Diffusion, Reflectivity, Doping, Thin film solar cells, Tandem solar cells

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PROCEEDINGS ARTICLE | April 28, 2010

Capacitive sensing circuit for closed-loop control of wide tuning range microspectrometers

Proc. SPIE. 7680, Next-Generation Spectroscopic Technologies III

KEYWORDS: Microelectromechanical systems, Mirrors, Light sources, Fabry–Perot interferometers, Capacitors, Calibration, Electrodes, Control systems, Linear filtering, Capacitance

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PROCEEDINGS ARTICLE | May 7, 2009

HgCdTe technology in Australia

Proc. SPIE. 7298, Infrared Technology and Applications XXXV

KEYWORDS: Infrared detectors, Long wavelength infrared, Mid-IR, Mirrors, Mercury cadmium telluride, Sensors, Interfaces, Photodiodes, Reactive ion etching, Superlattices

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PROCEEDINGS ARTICLE | April 29, 2009

MEMS-based Fabry-Perot microspectrometers for agriculture

Proc. SPIE. 7319, Next-Generation Spectroscopic Technologies II

KEYWORDS: Actuators, Optical filters, Mirrors, Fabry–Perot interferometers, Sensors, Calibration, Germanium, Silicon, Reflectivity, Transmittance

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PROCEEDINGS ARTICLE | December 30, 2008

Cross-flow microfiltration for lab-on-chip defatting of human breast milk

Proc. SPIE. 7270, Biomedical Applications of Micro- and Nanoengineering IV and Complex Systems

KEYWORDS: Breast, Microfluidics, Polymethylmethacrylate, Polymers, Nickel, Silicon, Lab on a chip, Chemical analysis, Plating, Electroplating

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PROCEEDINGS ARTICLE | January 9, 2008

Mechanical characteristics of filter structures for MEMS adaptive infrared detectors

Proc. SPIE. 6800, Device and Process Technologies for Microelectronics, MEMS, Photonics, and Nanotechnology IV

KEYWORDS: Microelectromechanical systems, Infrared detectors, Optical filters, Mirrors, Digital filtering, Finite element methods, Plasma enhanced chemical vapor deposition, Tunable filters, Structural design, Mechanical engineering

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PROCEEDINGS ARTICLE | November 1, 2007

Crystallization and compositional changes in amorphous PECVD SiNx thin films

Proc. SPIE. 6423, International Conference on Smart Materials and Nanotechnology in Engineering

KEYWORDS: Thin films, Crystals, Silicon, Heat treatments, Oxygen, Transmission electron microscopy, Silicon films, Plasma enhanced chemical vapor deposition, Photomicroscopy, Crystallography

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PROCEEDINGS ARTICLE | October 2, 2007

Micro-electromechanical systems-based microspectrometers covering wavelengths from 1500nm to 5000nm

Proc. SPIE. 6765, Next-Generation Spectroscopic Technologies

KEYWORDS: Microelectromechanical systems, Infrared detectors, Infrared sensors, Near infrared, Optical filters, Mirrors, Fabry–Perot interferometers, Sensors, Spectrometers, Infrared radiation

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PROCEEDINGS ARTICLE | May 14, 2007

Fabry-Pérot MEMS microspectrometers spanning the SWIR and MWIR

Proc. SPIE. 6542, Infrared Technology and Applications XXXIII

KEYWORDS: Microelectromechanical systems, Mid-IR, Short wave infrared radiation, Optical filters, Mirrors, Mercury cadmium telluride, Switching, Cadmium, Sensors, Mercury

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PROCEEDINGS ARTICLE | May 14, 2007

1/f noise in HgCdTe infrared gated photodiodes

Proc. SPIE. 6542, Infrared Technology and Applications XXXIII

KEYWORDS: Mid-IR, Mercury cadmium telluride, Diffusion, Resistance, Zinc, Amplifiers, Photodiodes, Diodes, Infrared radiation, Infrared photography

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PROCEEDINGS ARTICLE | May 14, 2007

Extending the tuning range of SWIR microspectrometers

Proc. SPIE. 6542, Infrared Technology and Applications XXXIII

KEYWORDS: Microelectromechanical systems, Infrared detectors, Actuators, Short wave infrared radiation, Mirrors, Fabry–Perot interferometers, Electrodes, Germanium, Finite element methods, Instrument modeling

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PROCEEDINGS ARTICLE | September 8, 2006

SWIR hyperspectral detection with integrated HgCdTe detector and tunable MEMS filter

Proc. SPIE. 6295, Infrared Detectors and Focal Plane Arrays VIII

KEYWORDS: Microelectromechanical systems, Short wave infrared radiation, Optical filters, Mirrors, Mercury cadmium telluride, Sensors, Photoresistors, Silicon, Tunable filters, Electronic filtering

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PROCEEDINGS ARTICLE | May 18, 2006

Resonant-cavity-enhanced HgCdTe photodetectors

Proc. SPIE. 6206, Infrared Technology and Applications XXXII

KEYWORDS: Oxides, Mirrors, Mercury cadmium telluride, Cadmium, Data modeling, Sensors, Photoresistors, Mercury, Tellurium, Temperature metrology

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PROCEEDINGS ARTICLE | May 18, 2006

Carrier transport characterization of high-density plasma-induced p-to-n type converted MWIR HgCdTe material

Proc. SPIE. 6206, Infrared Technology and Applications XXXII

KEYWORDS: Mercury cadmium telluride, Etching, Argon, Ions, Mercury, Photodiodes, Plasma etching, Reactive ion etching, Temperature metrology, Plasma

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PROCEEDINGS ARTICLE | April 21, 2006

Tunable Fabry-Perot filters operating in the 3 to 5 μm range for infrared micro-spectrometer applications

Proc. SPIE. 6186, MEMS, MOEMS, and Micromachining II

KEYWORDS: Microelectromechanical systems, Mid-IR, Short wave infrared radiation, Optical filters, Mirrors, Fabry–Perot interferometers, Silicon, Scanning electron microscopy, Infrared radiation, Tunable filters

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PROCEEDINGS ARTICLE | July 7, 2005

MEMS based tunable infrared sensors

Proc. SPIE. 5840, Photonic Materials, Devices, and Applications

KEYWORDS: Microelectromechanical systems, Infrared sensors, Short wave infrared radiation, Optical filters, Mirrors, Mercury cadmium telluride, Sensors, Silicon, Photodiodes, Infrared radiation

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PROCEEDINGS ARTICLE | May 31, 2005

A monolithically integrated HgCdTe SWIR photodetector and tunable MEMS-based optical filter

Proc. SPIE. 5783, Infrared Technology and Applications XXXI

KEYWORDS: Microelectromechanical systems, Infrared detectors, Short wave infrared radiation, Optical filters, Mirrors, Fabry–Perot interferometers, Mercury cadmium telluride, Sensors, Photoresistors, Silicon

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PROCEEDINGS ARTICLE | May 19, 2005

Determination of mechanical properties of silicon nitride thin films using nanoindentation

Proc. SPIE. 5798, Spaceborne Sensors II

KEYWORDS: Microelectromechanical systems, Thin films, Diamond, Microsystems, Silicon, Reliability, Control systems, Silicon films, Plasma enhanced chemical vapor deposition, Thin film deposition

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PROCEEDINGS ARTICLE | April 2, 2004

Chemical structure of low-temperature plasma-deposited silicon nitride thin films

Proc. SPIE. 5276, Device and Process Technologies for MEMS, Microelectronics, and Photonics III

KEYWORDS: Microelectromechanical systems, Thermography, Thin films, Oscillators, Silicon, Chemical vapor deposition, Silicon films, Infrared radiation, Plasma, Absorption

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PROCEEDINGS ARTICLE | April 2, 2004

Determination of residual stress in low-temperature PECVD silicon nitride thin films

Proc. SPIE. 5276, Device and Process Technologies for MEMS, Microelectronics, and Photonics III

KEYWORDS: Thin films, Mercury cadmium telluride, Particles, Silicon, Diagnostics, Silicon films, Plasma enhanced chemical vapor deposition, Thin film deposition, Thin film diagnostics, Temperature metrology

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PROCEEDINGS ARTICLE | March 30, 2004

Magnetoresistance characteristics of gamma-irradiated Al0.35Ga0.65N/GaN HFETs

Proc. SPIE. 5274, Microelectronics: Design, Technology, and Packaging

KEYWORDS: Interfaces, Resistance, Magnetism, Gallium nitride, Diodes, Aluminum, Field effect transistors, Gamma radiation, Gallium, Heterojunctions

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PROCEEDINGS ARTICLE | March 30, 2004

The effects of vacuum baking on the I-V characteristics of LWIR HgCdTe photodiodes

Proc. SPIE. 5274, Microelectronics: Design, Technology, and Packaging

KEYWORDS: Packaging, Long wavelength infrared, Modeling, Mercury cadmium telluride, Data modeling, Resistance, Photodiodes, Diodes, Measurement devices, Plasma

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PROCEEDINGS ARTICLE | March 30, 2004

Characterization of crosstalk in HgCdTe n-on-p photovoltaic infrared arrays

Proc. SPIE. 5274, Microelectronics: Design, Technology, and Packaging

KEYWORDS: Staring arrays, Modeling, Photovoltaics, Mercury cadmium telluride, Data modeling, Diffusion, Photodiodes, Semiconductor lasers, Diodes, Infrared radiation

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PROCEEDINGS ARTICLE | March 30, 2004

Accurate determination of composition profiles in abrupt MBE-grown HgCdTe heterostructures

Proc. SPIE. 5274, Microelectronics: Design, Technology, and Packaging

KEYWORDS: Refractive index, Mercury cadmium telluride, Cadmium, Data modeling, Ions, Mercury, Infrared radiation, Tellurium, Thermal modeling, Absorption

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SPIE Conference Volume | March 29, 2004

BioMEMS and Nanotechnology

PROCEEDINGS ARTICLE | March 25, 2004

Refractive index engineering for a distributed Bragg reflector for a resonant-cavity-enhanced detector

Proc. SPIE. 5277, Photonics: Design, Technology, and Packaging

KEYWORDS: Reflectors, Refractive index, Mirrors, Mercury cadmium telluride, Cadmium, Sensors, Germanium, Mercury, Reflectivity, Distributed Bragg reflectors

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PROCEEDINGS ARTICLE | December 5, 2002

HgCdTe long-wavelength infrared photovoltaic detectors formed by reactive ion etching

Proc. SPIE. 4795, Materials for Infrared Detectors II

KEYWORDS: Infrared detectors, Long wavelength infrared, Gold, Mid-IR, Mercury cadmium telluride, Photodiodes, Diodes, Infrared radiation, Reactive ion etching, Temperature metrology

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PROCEEDINGS ARTICLE | December 5, 2002

Minority carrier lifetime in abrupt MBE-grown HgCdTe heterostructures

Proc. SPIE. 4795, Materials for Infrared Detectors II

KEYWORDS: Infrared sensors, Mercury cadmium telluride, Sensors, Photoresistors, Interfaces, Ions, Mercury, Heterojunctions, Tellurium, Temperature metrology

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PROCEEDINGS ARTICLE | November 14, 2002

Toward MEMS-based infrared tunable microspectrometers

Proc. SPIE. 4935, Smart Structures, Devices, and Systems

KEYWORDS: Microelectromechanical systems, Infrared detectors, Mirrors, Mercury cadmium telluride, Sensors, Spectrometers, Silicon, Infrared radiation, Shape analysis, Plasma enhanced chemical vapor deposition

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PROCEEDINGS ARTICLE | November 19, 2001

Mobility spectrum techniques for characterizing multilayer semiconductor structures

Proc. SPIE. 4593, Design, Characterization, and Packaging for MEMS and Microelectronics II

KEYWORDS: Long wavelength infrared, Semiconductors, Gold, Mid-IR, Mercury cadmium telluride, Etching, Mercury, Magnetism, Reactive ion etching, Temperature metrology

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PROCEEDINGS ARTICLE | November 19, 2001

60Co gamma-irradiation-induced defects in MOCVD n-GaN

Proc. SPIE. 4593, Design, Characterization, and Packaging for MEMS and Microelectronics II

KEYWORDS: Annealing, Electrons, Nitrogen, Gallium nitride, Capacitance, Diodes, Gamma radiation, Convolution, Metalorganic chemical vapor deposition, Temperature metrology

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PROCEEDINGS ARTICLE | November 12, 2001

RIE-induced n-on-p junction HgCdTe photodiodes: effects of passivant technology on bake stability

Proc. SPIE. 4454, Materials for Infrared Detectors

KEYWORDS: Mercury cadmium telluride, Cadmium, Electrons, Interfaces, Mercury, Zinc, Photodiodes, Diodes, Reactive ion etching, Tellurium

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PROCEEDINGS ARTICLE | October 20, 2000

Tunable Fabry-Perot cavities

Proc. SPIE. 4230, Micromachining and Microfabrication

KEYWORDS: Microelectromechanical systems, Fabry–Perot interferometers, Etching, Silicon, Reflectivity, Zinc, Silicon films, Finite element methods, Low pressure chemical vapor deposition, Plasma enhanced chemical vapor deposition

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PROCEEDINGS ARTICLE | October 8, 1999

Laser-beam-induced current technique as a quantitative tool for HgCdTe photodiode characterization

Proc. SPIE. 3893, Design, Characterization, and Packaging for MEMS and Microelectronics

KEYWORDS: Long wavelength infrared, Thermography, Modeling, Photovoltaics, Mercury cadmium telluride, Diffusion, Nondestructive evaluation, Photodiodes, Diodes, Semiconducting wafers

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PROCEEDINGS ARTICLE | October 8, 1999

Anomalous drain current-voltage characteristics in AlGaN/GaN MODFETs at low temperatures

Proc. SPIE. 3893, Design, Characterization, and Packaging for MEMS and Microelectronics

KEYWORDS: Electrons, Silicon, Resistance, Gallium nitride, Sapphire, Ionization, Transistors, Field effect transistors, Heterojunctions, Temperature metrology

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PROCEEDINGS ARTICLE | October 1, 1999

Transferable silicon nitride microcavities

Proc. SPIE. 3892, Device and Process Technologies for MEMS and Microelectronics

KEYWORDS: Microelectromechanical systems, Gold, Etching, Gallium arsenide, Silicon, Reflectivity, Zinc, Plasma enhanced chemical vapor deposition, Reactive ion etching, Optical microcavities

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PROCEEDINGS ARTICLE | October 1, 1999

Excess noise in MWIR photovoltaic detectors fabricated using a new junction formation technology

Proc. SPIE. 3892, Device and Process Technologies for MEMS and Microelectronics

KEYWORDS: Mid-IR, Mercury cadmium telluride, Diffusion, Resistance, Zinc, Photodiodes, Diodes, Reactive ion etching, Temperature metrology, Plasma

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PROCEEDINGS ARTICLE | April 15, 1997

Isothermal vapor phase epitaxy as a versatile technology for infrared photodetectors

Proc. SPIE. 2999, Photodetectors: Materials and Devices II

KEYWORDS: Photodetectors, Photovoltaics, Photoresistors, Mercury, Doping, Infrared radiation, Epitaxy, Infrared photography, Heterojunctions, Vapor phase epitaxy

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PROCEEDINGS ARTICLE | September 8, 1995

Long-wavelength infrared photoconductor technology based on epitaxially grown Hg1-xCdxTe

Proc. SPIE. 2552, Infrared Technology XXI

KEYWORDS: Long wavelength infrared, Semiconductors, Photovoltaics, Cadmium, Sensors, Photoresistors, Infrared radiation, Chemical elements, Heterojunctions, Tellurium

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PROCEEDINGS ARTICLE | September 8, 1995

Status of MWIR HgCdTe photovoltaic detector technology in Australia

Proc. SPIE. 2552, Infrared Technology XXI

KEYWORDS: Mid-IR, Mercury cadmium telluride, Sensors, Diffusion, Resistance, Zinc, Photodiodes, Diodes, Boron, Photovoltaic detectors

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PROCEEDINGS ARTICLE | October 3, 1994

Erasure of poling-induced second-order optical nonlinearities in silica by UV exposure

Proc. SPIE. 2289, Doped Fiber Devices and Systems

KEYWORDS: Second-harmonic generation, Silica, Electrodes, Glasses, Ultraviolet radiation, Ions, Nonlinear optics, Phase matching, Harmonic generation, Temperature metrology

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