Prof. John F. Federici
Professor of Physics at New Jersey Institute of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (26)

Proceedings Article | 2 May 2017
Proc. SPIE. 10206, Disruptive Technologies in Sensors and Sensor Systems
KEYWORDS: Refractive index, Multilayers, Spectroscopy, Ultraviolet radiation, Coating, Reflectivity, Nondestructive evaluation, Scanning electron microscopy, Humidity, Terahertz radiation, Reflectance spectroscopy, Testing and analysis, Data analysis

Proceedings Article | 18 February 2008
Proc. SPIE. 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
KEYWORDS: Capacitors, Silica, Sensors, Etching, Metals, Silicon, Silicon films, Low pressure chemical vapor deposition, Plasma enhanced chemical vapor deposition, Reactive ion etching

Proceedings Article | 12 February 2008
Proc. SPIE. 6886, Microfluidics, BioMEMS, and Medical Microsystems VI
KEYWORDS: Optical lithography, Capacitors, Silica, Sensors, Metals, Silicon, Finite element methods, Photomasks, Low pressure chemical vapor deposition, Plasma enhanced chemical vapor deposition

Proceedings Article | 4 May 2007
Proc. SPIE. 6549, Terahertz for Military and Security Applications V
KEYWORDS: Weapons, Imaging systems, Sensors, Image resolution, Interferometry, Detector arrays, Terahertz radiation, Explosives, Spherical lenses, Absorption

Proceedings Article | 19 January 2007
Proc. SPIE. 6463, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
KEYWORDS: Thin films, LabVIEW, Sensors, Nitrogen, Physics, Power supplies, Data acquisition, Relays, Oscilloscopes, Electronic circuits

Showing 5 of 26 publications
Conference Committee Involvement (3)
Disruptive Technologies in Sensors and Sensor Systems
11 April 2017 | Anaheim, California, United States
Terahertz Physics, Devices, and Systems II
11 September 2007 | Boston, MA, United States
Terahertz Physics, Devices, and Systems
2 October 2006 | Boston, Massachusetts, United States
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