Dr. John W. Freeland
Assistant Physicist at Argonne National Lab
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | March 15, 2011
Proc. SPIE. 7940, Oxide-based Materials and Devices II
KEYWORDS: Semiconductors, Titanium dioxide, Electrons, Interfaces, Control systems, Signal detection, Heterojunctions, Scanning tunneling microscopy, Complex oxides, Perovskite

PROCEEDINGS ARTICLE | November 16, 1999
Proc. SPIE. 3773, X-Ray Optics Design, Performance, and Applications
KEYWORDS: Multilayers, Iron, Ferromagnetics, Scattering, Crystals, X-rays, Magnetism, Cobalt, Absorption, Correlation function

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