Mr. John Gookassian
R&D Engineer, Staff at Synopsys Inc
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | October 16, 2017
Proc. SPIE. 10451, Photomask Technology
KEYWORDS: Metrology, Manufacturing, Inspection, Computer simulations, SRAF, Process modeling

PROCEEDINGS ARTICLE | November 9, 2005
Proc. SPIE. 5992, 25th Annual BACUS Symposium on Photomask Technology
KEYWORDS: Data modeling, Databases, Manufacturing, Inspection, Design for manufacturing, Photomasks, Optical proximity correction, Semiconducting wafers, Model-based design, Resolution enhancement technologies

PROCEEDINGS ARTICLE | May 5, 2005
Proc. SPIE. 5756, Design and Process Integration for Microelectronic Manufacturing III
KEYWORDS: Human-machine interfaces, Databases, Manufacturing, Distortion, Design for manufacturing, Photomasks, Data conversion, Semiconducting wafers, Electronic design automation, Design for manufacturability

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