Dr. John W. Haas
Research Associate at Applied Research Associates Inc
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | May 21, 2015
Proc. SPIE. 9473, Geospatial Informatics, Fusion, and Motion Video Analytics V
KEYWORDS: Data modeling, Sensors, Calibration, Ions, Data processing, Software development, Gyroscopes, Neodymium, Algorithm development, Global Positioning System

PROCEEDINGS ARTICLE | June 3, 2013
Proc. SPIE. 8724, Ocean Sensing and Monitoring V
KEYWORDS: Fabry–Perot interferometers, FT-IR spectroscopy, Principal component analysis, Data modeling, Spectroscopy, Infrared spectroscopy, Palladium, Absorbance, Performance modeling, Data analysis

PROCEEDINGS ARTICLE | May 29, 2013
Proc. SPIE. 8710, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XIV
KEYWORDS: Explosives detection, Sensors, Glasses, Ions, Robotics, Lamps, Head, Explosives, Improvised explosive devices, Land mines

PROCEEDINGS ARTICLE | September 4, 1998
Proc. SPIE. 3392, Detection and Remediation Technologies for Mines and Minelike Targets III
KEYWORDS: Gold, Sensors, Metals, Silver, Surface enhanced Raman spectroscopy, Raman spectroscopy, Chemical analysis, Explosives, Land mines, Absorption

PROCEEDINGS ARTICLE | October 9, 1995
Proc. SPIE. 2504, Environmental Monitoring and Hazardous Waste Site Remediation
KEYWORDS: Optical fibers, Optical filters, Sensors, Luminescence, Mercury, Lamps, Laser induced fluorescence, Prototyping, Soil contamination, Bandpass filters

PROCEEDINGS ARTICLE | May 14, 1992
Proc. SPIE. 1636, Applied Spectroscopy in Materials Science II
KEYWORDS: Scattering, Metals, Spectroscopy, Silver, Light scattering, Surface roughness, Surface enhanced Raman spectroscopy, Transmission electron microscopy, Raman scattering, Scanning tunneling microscopy

Showing 5 of 9 publications
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