Prof. John C. Howell
at Hebrew Univ of Jerusalem
SPIE Involvement:
Conference Program Committee | Author
Publications (5)

PROCEEDINGS ARTICLE | September 30, 2016
Proc. SPIE. 9948, Novel Optical Systems Design and Optimization XIX
KEYWORDS: Metamaterials, Visible radiation, Eye, Optical signal processing, Cameras, Sensors, Spatial resolution, Geometrical optics, 3D displays, Integral imaging

PROCEEDINGS ARTICLE | May 21, 2015
Proc. SPIE. 9500, Quantum Information and Computation XIII
KEYWORDS: Photodetectors, Astronomy, Sensors, Particles, Physics, Neodymium, Information theory, Nonlinear crystals, Quantum information, Quantum cryptography

PROCEEDINGS ARTICLE | May 21, 2015
Proc. SPIE. 9500, Quantum Information and Computation XIII
KEYWORDS: Imaging systems, Sensors, Fourier transforms, CCD cameras, Spatial light modulators, Image quality, Image filtering, Charge-coupled devices, Electroluminescent displays, Compressed sensing

PROCEEDINGS ARTICLE | February 27, 2015
Proc. SPIE. 9371, Photonic and Phononic Properties of Engineered Nanostructures V
KEYWORDS: Metamaterials, Lenses, Cameras, Matrices, Physics, Refraction, Geometrical optics, Astronomical imaging, Paraxial approximations, Alternate lighting of surfaces

PROCEEDINGS ARTICLE | April 4, 2005
Proc. SPIE. 5735, Advanced Optical and Quantum Memories and Computing II
KEYWORDS: Transparency, Switching, Doppler effect, Chemical species, Photons, Magnetism, Raman spectroscopy, Nonlinear optics, Rubidium, Absorption

Conference Committee Involvement (12)
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
2 February 2019 | San Francisco, California, United States
Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
29 January 2018 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
30 January 2017 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX
15 February 2016 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII
8 February 2015 | San Francisco, California, United States
Showing 5 of 12 published special sections
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