John Kam
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Modulation, Image processing, Particles, Inspection, Optical inspection, Data processing

SPIE Journal Paper | 26 March 2019
OE Vol. 58 Issue 09
KEYWORDS: Particles, Modulation, Optical inspection, Sensors, Light emitting diodes, Signal to noise ratio, Inspection, Light sources, Optical engineering, Data processing

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