Dr. John Lajoie
at Iowa State Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 February 2020 Presentation + Paper
Proceedings Volume 11246, 1124604 (2020) https://doi.org/10.1117/12.2545261
KEYWORDS: Atomic force microscopy, Microscopes, Collimation, Molecules, Atomic force microscope, Luminescence, Sensors, Field programmable gate arrays, Motion measurement, Wave plates

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