Dr. John M. Lannon
General Manager at Micross Advanced Interconnect Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (20)

Proceedings Article | 3 May 2016
Proc. SPIE. 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
KEYWORDS: Packaging, Infrared detectors, Mid-IR, Sensors, Detector development, Projection systems, Infrared radiation, Integrated circuits, Integrated circuit design, Temperature metrology

Proceedings Article | 12 May 2015
Proc. SPIE. 9452, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
KEYWORDS: Mid-IR, Etching, Dry etching, Metals, Dielectrics, Silicon, Resistance, Infrared radiation, Resistors, Semiconducting wafers

Proceedings Article | 12 May 2015
Proc. SPIE. 9452, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
KEYWORDS: Packaging, Infrared detectors, Mid-IR, Electronics, Sensors, Silicon, Detector development, Projection systems, Infrared radiation, Integrated circuits

Proceedings Article | 9 June 2014
Proc. SPIE. 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV
KEYWORDS: Packaging, Nonuniformity corrections, Infrared imaging, Mid-IR, Dielectrics, Projection systems, Infrared radiation, Integrated circuits, Spatial resolution, Device simulation

Proceedings Article | 29 May 2014
Proc. SPIE. 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV
KEYWORDS: Packaging, Infrared imaging, Silicon, Scanning electron microscopy, Projection systems, Infrared radiation, Integrated circuits, Semiconducting wafers, Cryogenics, Infrared systems engineering

Showing 5 of 20 publications
Conference Committee Involvement (8)
Technologies for Synthetic Environments: Hardware-in-the-Loop XVIII
2 May 2013 | Baltimore, Maryland, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop XVII
25 April 2012 | Baltimore, Maryland, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop XVI
27 April 2011 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
7 April 2010 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV
13 April 2009 | Orlando, Florida, United States
Showing 5 of 8 Conference Committees
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