Dr. John Lawler
President at Advanced Thermal and Environmental Concepts Inc
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | April 11, 2008
Proc. SPIE. 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
KEYWORDS: Thermography, Light emitting diodes, Sensors, Metals, 3D modeling, Black bodies, Infrared radiation, Electro optics, Semiconducting wafers, Thermal modeling

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