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John B. Medberry
Sr. Application Engineer at Keysight Technologies, Inc.
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Publications (1)
Proceedings Article | 19 April 2000 Paper
Thermal effects in multiple-pass p-i-n photodiodes
David Cooper, John Medberry, Keith Williams
Proceedings Volume 3950, (2000) https://doi.org/10.1117/12.382176
KEYWORDS: Indium gallium arsenide, Photodetectors, Microwave radiation, PIN photodiodes, Quantum efficiency, Thermal effects, Palladium, Refraction, Optical resonators, Gold
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