John Mongelli
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 September 2011
Proc. SPIE. 8132, Time and Frequency Metrology III
KEYWORDS: Femtosecond phenomena, Numerical simulations, 3D modeling, Xenon, Frequency combs, Ionization, Extreme ultraviolet, High harmonic generation, Plasma, Phase shifts

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