John C. Moore
Technical Director at DAETEC LLC
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 March 2015 Paper
John Moore, Alex Brewer, Alman Law, Jared Pettit
Proceedings Volume 9425, 942519 (2015) https://doi.org/10.1117/12.2175826
KEYWORDS: Copper, Chemistry, Semiconducting wafers, Photoresist materials, Metals, Liquids, Plating, Etching, Scanning electron microscopy, Printing

Proceedings Article | 5 April 2007 Paper
Proceedings Volume 6518, 651841 (2007) https://doi.org/10.1117/12.713407
KEYWORDS: Particles, Semiconducting wafers, Diffractive optical elements, Surface finishing, Statistical analysis, Liquids, Semiconductors, Water, Foam, Chemistry

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