John Myrick
President at Base Lab Tools Inc
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 22, 2003
Proc. SPIE. 5180, Optical Manufacturing and Testing V
KEYWORDS: Microscopes, Monochromatic aberrations, Point spread functions, Interferometers, Cameras, Sensors, Wavefronts, Image analysis, Modulation transfer functions, CCD image sensors

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top