Mr. John J. Nemechek
President at Metrology Concepts LLC
SPIE Involvement:
Conference Program Committee | Symposium Committee | Author
Publications (4)

PROCEEDINGS ARTICLE | October 12, 2015
Proc. SPIE. 9633, Optifab 2015
KEYWORDS: Unmanned aerial vehicles, Photovoltaics, Sensors, Interferometry, Wavefront sensors, Wavefronts, Optical testing, Objectives, Aluminum, Temperature metrology

PROCEEDINGS ARTICLE | May 2, 2005
Proc. SPIE. 10315, Optifab 2005: Technical Digest
KEYWORDS: Confocal microscopy, Eye, Interferometers, Interferometry, Environmental sensing

PROCEEDINGS ARTICLE | September 1, 1998
Proc. SPIE. 3412, Photomask and X-Ray Mask Technology V
KEYWORDS: Optical design, Prisms, Beam splitters, Polishing, Reflection, Interferometers, Interferometry, Process control, Photomasks, Surface finishing

PROCEEDINGS ARTICLE | November 25, 1993
Proc. SPIE. 2000, Current Developments in Optical Design and Optical Engineering III
KEYWORDS: Optical components, Monochromatic aberrations, Mirrors, Beam splitters, Lenses, Interferometers, Reflectivity, Wavefronts, Spherical lenses, Combined lens-mirror systems

Conference Committee Involvement (10)
Optifab 2017
16 October 2017 | Rochester, New York, United States
Optifab 2015
12 October 2015 | Rochester, New York, United States
Optifab 2013
14 October 2013 | Rochester, New York, United States
Optifab
9 May 2011 | Rochester, New York, United States
SPIE Optifab
9 May 2011 | Rochester, United States
Showing 5 of 10 published special sections
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