Dr. John S. Roberts
at Univ of Sheffield
SPIE Involvement:
Conference Program Committee | Author
Publications (20)

PROCEEDINGS ARTICLE | February 26, 2010
Proc. SPIE. 7597, Physics and Simulation of Optoelectronic Devices XVIII
KEYWORDS: Semiconductors, Mirrors, Quantum wells, Nanostructuring, Solar cells, Gallium arsenide, Indium, Quantum efficiency, Reflectivity, Absorption

PROCEEDINGS ARTICLE | February 12, 2010
Proc. SPIE. 7616, Novel In-Plane Semiconductor Lasers IX
KEYWORDS: Waveguides, Cladding, Etching, Gallium arsenide, Reflectivity, Semiconductor lasers, Integrated circuits, Photonic integrated circuits, Indium gallium phosphide

PROCEEDINGS ARTICLE | October 25, 2006
Proc. SPIE. 6386, Optical Methods in the Life Sciences
KEYWORDS: Continuous wave operation, Waveguides, Polarization, Spectroscopy, Electrons, Quantum cascade lasers, Transmittance, Laser damage threshold, Temperature metrology, Absorption

PROCEEDINGS ARTICLE | November 18, 2005
Proc. SPIE. 6010, Infrared to Terahertz Technologies for Health and the Environment
KEYWORDS: Continuous wave operation, Waveguides, Cladding, Etching, Gallium arsenide, Silicon, Quantum cascade lasers, Semiconductor lasers, Pulsed laser operation, Temperature metrology

Proc. SPIE. 5725, Ultrafast Phenomena in Semiconductors and Nanostructure Materials IX
KEYWORDS: Electronics, Quantum wells, Gallium arsenide, Reflectivity, Physics, Electroluminescence, Aluminum, Vertical cavity surface emitting lasers, Gallium, Temperature metrology

PROCEEDINGS ARTICLE | October 22, 2004
Proc. SPIE. 5564, Infrared Detector Materials and Devices
KEYWORDS: Indium gallium arsenide, Switching, Waveguides, Silicon, Quantum cascade lasers, Doping, Semiconducting wafers, Superlattices, Vapor phase epitaxy, Temperature metrology

Showing 5 of 20 publications
Conference Committee Involvement (1)
Photonic Materials, Devices, and Applications
9 May 2005 | Sevilla, Spain
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