John R. Stoup
Mechanical Engineer at National Institute of Standards and Technology
SPIE Involvement:
Publications (9)

Proceedings Article | 14 August 2006
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Nanotechnology, Metrology, Spectroscopy, Control systems, Vibration control, Humidity, Distance measurement, Nanofabrication, Standards development, Temperature metrology

Proceedings Article | 18 August 2005
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Mirrors, Beam splitters, Metrology, Imaging systems, Interferometers, Sensors, Calibration, Interferometry, Aspheric lenses, Spherical lenses

Proceedings Article | 18 August 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Microscopes, Metrology, Optical spheres, Interferometers, Cameras, Calibration, Glasses, Chromium, 3D metrology, Adhesives

Proceedings Article | 20 November 2003
Proc. SPIE. 5190, Recent Developments in Traceable Dimensional Measurements II
KEYWORDS: Optical spheres, Silica, Interferometers, Calibration, Error analysis, Silicon, Refraction, Motion measurement, Zerodur, Surface finishing

Proceedings Article | 22 October 2001
Proc. SPIE. 4401, Recent Developments in Traceable Dimensional Measurements
KEYWORDS: Metrology, Optical spheres, Calibration, Error analysis, Interferometry, 3D metrology, Motion measurement, Environmental sensing, Surface finishing, Standards development

Proceedings Article | 30 September 1998
Proc. SPIE. 3477, Recent Developments in Optical Gauge Block Metrology
KEYWORDS: Metrology, Reflection, Calibration, Quartz, Glasses, Interferometry, Phase measurement, Tolerancing, Surface finishing, Standards development

Showing 5 of 9 publications
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