Dr. John Szymanski
Program Director at
SPIE Involvement:
Conference Program Committee | Author
Publications (25)

PROCEEDINGS ARTICLE | August 2, 2002
Proc. SPIE. 4725, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery VIII
KEYWORDS: Staring arrays, Thermography, Infrared imaging, Calibration, Satellites, Distortion, Satellite imaging, Multispectral imaging, Image quality, Space operations

PROCEEDINGS ARTICLE | August 2, 2002
Proc. SPIE. 4725, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery VIII
KEYWORDS: Data modeling, Sensors, Image processing, Remote sensing, Computer programming, Feature extraction, Multispectral imaging, Machine learning, Genetics, Evolutionary algorithms

PROCEEDINGS ARTICLE | August 2, 2002
Proc. SPIE. 4725, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery VIII
KEYWORDS: Thermography, Image segmentation, Image processing, Remote sensing, Sulfur, Clouds, Feature extraction, Multispectral imaging, Image classification, Classification systems

PROCEEDINGS ARTICLE | January 17, 2002
Proc. SPIE. 4480, Imaging Spectrometry VII
KEYWORDS: Hyperspectral imaging, Clocks, Image segmentation, Image processing, Image resolution, Field programmable gate arrays, Image analysis, Multispectral imaging, Algorithm development, Earth observing sensors

PROCEEDINGS ARTICLE | January 17, 2002
Proc. SPIE. 4480, Imaging Spectrometry VII
KEYWORDS: Image processing algorithms and systems, Logic, Image segmentation, Remote sensing, Field programmable gate arrays, Multispectral imaging, Data processing, Data centers, Algorithm development, Expectation maximization algorithms

PROCEEDINGS ARTICLE | January 17, 2002
Proc. SPIE. 4480, Imaging Spectrometry VII
KEYWORDS: Landsat, Satellites, Image processing, Remote sensing, Clouds, Multispectral imaging, Machine learning, Image classification, Binary data, Earth observing sensors

Showing 5 of 25 publications
Conference Committee Involvement (9)
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII
11 April 2007 | Orlando, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVII
19 April 2006 | Orlando (Kissimmee), Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI
30 March 2005 | Orlando, Florida, United States
Imaging Spectrometry X
2 August 2004 | Denver, Colorado, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV
14 April 2004 | Orlando, Florida, United States
Showing 5 of 9 published special sections
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top