John R. Taylor
Physicist at
SPIE Involvement:
Conference Program Committee | Author
Publications (22)

Proceedings Article | 7 February 2006
Proc. SPIE. 5991, Laser-Induced Damage in Optical Materials: 2005
KEYWORDS: Mirrors, Antireflective coatings, Silica, Laser induced damage, Coating, Laser development, Optical testing, Laser optics, National Ignition Facility, Yield improvement

Proceedings Article | 30 May 2003
Proc. SPIE. 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
KEYWORDS: Antireflective coatings, Polishing, Lenses, Laser induced damage, Surface roughness, Aspheric lenses, Laser damage threshold, National Ignition Facility, Magnetorheological finishing, Surface finishing

Proceedings Article | 27 December 2002
Proc. SPIE. 4889, 22nd Annual BACUS Symposium on Photomask Technology
KEYWORDS: Microscopes, Mirrors, Imaging systems, Inspection, Objectives, Photomasks, Extreme ultraviolet, Extreme ultraviolet lithography, Zone plates, EUV optics

Proceedings Article | 11 September 2002
Proc. SPIE. 4774, Optical System Contamination: Effects, Measurements, and Control VII
KEYWORDS: Optical components, Light sources, Roads, Contamination, Silica, Optical coatings, Inspection, Reflectivity, Natural surfaces, National Ignition Facility

Proceedings Article | 1 July 2002
Proc. SPIE. 4688, Emerging Lithographic Technologies VI
KEYWORDS: Lithography, Mirrors, Reticles, Interferometry, Wavefronts, Printing, Extreme ultraviolet, Modulation transfer functions, Critical dimension metrology, Fiber optic illuminators

Proceedings Article | 12 April 2001
Proc. SPIE. 4347, Laser-Induced Damage in Optical Materials: 2000
KEYWORDS: Reflectors, Mirrors, Silica, Sputter deposition, Metals, Optical coatings, Optical testing, Laser beam diagnostics, Calorimetry, Absorption

Showing 5 of 22 publications
Conference Committee Involvement (2)
Optical Manufacturing and Testing VI
31 July 2005 | San Diego, California, United States
Optical Manufacturing and Testing V
3 August 2003 | San Diego, California, United States
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