Dr. Jolanta Sztuk-Dambietz
Detector Scientist at European XFEL GmbH
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 3, 2013
Proc. SPIE. 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation
KEYWORDS: Sensors, Calibration, Particles, X-rays, X-ray sources, Monte Carlo methods, Image sensors, Detector development, X-ray detectors, Hard x-rays

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