Dr. Jolanta Sztuk-Dambietz
Detector Scientist at European XFEL GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 May 2013
Proc. SPIE. 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation
KEYWORDS: Sensors, X-rays, Calibration, X-ray detectors, Detector development, Monte Carlo methods, Particles, X-ray sources, Image sensors, Hard x-rays

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