Prof. Jon Yngve Hardeberg
Professor at Norwegian Univ of Science and Technology
SPIE Involvement:
Senior status | Conference Program Committee | Author
Publications (47)

SPIE Journal Paper | May 21, 2018
JEI Vol. 27 Issue 03
KEYWORDS: Image quality, Image resolution, Spatial light modulators, Visualization, Projection systems, Image enhancement, Image analysis, Signal to noise ratio, Distortion, Resolution enhancement technologies

PROCEEDINGS ARTICLE | February 19, 2018
Proc. SPIE. 10489, Optical Biopsy XVI: Toward Real-Time Spectroscopic Imaging and Diagnosis
KEYWORDS: Optical filters, Light sources, Tissues, Imaging systems, Cameras, Skin, Oxygen, Chromophores, Near infrared spectroscopy, Tissue optics

PROCEEDINGS ARTICLE | February 15, 2017
Proc. SPIE. 10057, Multimodal Biomedical Imaging XII
KEYWORDS: Optical components, Light emitting diodes, Biomedical optics, Sensors, Blood, Image processing, Skin, Reflectivity, Imaging spectroscopy, Optical testing, Chromophores, Monte Carlo methods, Tissue optics

PROCEEDINGS ARTICLE | February 27, 2015
Proc. SPIE. 9405, Image Processing: Machine Vision Applications VIII
KEYWORDS: Optical filters, Light emitting diodes, Imaging systems, Photography, Manufacturing, Reflectivity, Multispectral imaging, Printing, Process control, Densitometry

PROCEEDINGS ARTICLE | February 8, 2015
Proc. SPIE. 9395, Color Imaging XX: Displaying, Processing, Hardcopy, and Applications
KEYWORDS: Visual process modeling, Visualization, Calibration, Reflectivity, Printing, Color difference, Optimization (mathematics), Nonimpact printing, Performance modeling, Spectral models

PROCEEDINGS ARTICLE | February 8, 2015
Proc. SPIE. 9396, Image Quality and System Performance XII
KEYWORDS: Light sources, Image compression, Visualization, Cameras, Calibration, Databases, Skin, Image analysis, Hyperspectral systems, Image quality

Showing 5 of 47 publications
Conference Committee Involvement (3)
Measuring, Modeling, and Reproducing Material Appearance 2015
9 February 2015 | San Francisco, California, United States
Measuring, Modeling, and Reproducing Material Appearance
3 February 2014 | San Francisco, California, United States
Spectral Imaging: Eighth International Symposium on Multispectral Color Science
16 January 2006 | San Jose, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top