Jon Christopher Case
at Affiliated Engineers Inc
SPIE Involvement:
Conference Program Committee | Author
Publications (1)

Proceedings Article | 18 August 2005
Proc. SPIE. 5933, Buildings for Nanoscale Research and Beyond
KEYWORDS: Semiconductors, Carbon, Optical filters, Contamination, Phase modulation, Particles, Manufacturing, Atmospheric particles, Performance modeling, Systems modeling

Conference Committee Involvement (1)
Buildings for Nanoscale Research and Beyond
31 July 2005 | San Diego, California, United States
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