Prof. Jonathan M. Huntley
at Loughborough Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (41)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Hyperspectral imaging, Mirrors, Microlens array, Modulation, Fiber Bragg gratings, Imaging systems, Speckle, Fourier transforms, Interferometry, Personal digital assistants, Distance measurement, Light

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10334, Automated Visual Inspection and Machine Vision II
KEYWORDS: Mathematical modeling, Detection and tracking algorithms, Data modeling, Manufacturing, Control systems, Clouds, 3D modeling, 3D metrology, Machine vision, Object recognition, Factor analysis, 3D image processing

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9530, Automated Visual Inspection and Machine Vision
KEYWORDS: Mathematical modeling, Gold, Image processing algorithms and systems, Visual process modeling, Detection and tracking algorithms, Image segmentation, Clouds, 3D modeling, Object recognition, Optimization (mathematics)

PROCEEDINGS ARTICLE | September 11, 2012
Proc. SPIE. 8413, Speckle 2012: V International Conference on Speckle Metrology
KEYWORDS: Hyperspectral imaging, Imaging systems, Speckle, Interferometers, Interferometry, Image sensors, Frequency combs, Optical interferometry, Spatial resolution, 3D image processing

SPIE Journal Paper | October 1, 2011
OE Vol. 50 Issue 10
KEYWORDS: Digital image correlation, 3D image processing, Cameras, 3D metrology, Error analysis, Clouds, Statistical analysis, Projection systems, Speckle pattern, Optical engineering

SPIE Journal Paper | May 1, 2011
OE Vol. 50 Issue 05
KEYWORDS: Clouds, Hough transforms, Calibration, 3D modeling, Optical spheres, Optical engineering, Optical calibration, Manufacturing, Convolution, Data processing

Showing 5 of 41 publications
Conference Committee Involvement (2)
Optical Metrology in Production Engineering
27 April 2004 | Strasbourg, France
Laser Interferometry X: Techniques and Analysis
31 July 2000 | San Diego, CA, United States
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