Jonathan L. Kirschman
Research Associate at Lawrence Berkeley National Lab
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | 1 August 2009
OE Vol. 48 Issue 08
KEYWORDS: Mirrors, Calibration, Ray tracing, Optical engineering, Computer programming, Metrology, Error analysis, Geometrical optics, Synchrotrons, Light sources

Proceedings Article | 3 September 2008 Paper
Proc. SPIE. 7077, Advances in X-Ray/EUV Optics and Components III
KEYWORDS: Optical components, Mirrors, X-ray optics, Metrology, Cameras, Sensors, Calibration, Error analysis, CCD image sensors, Channel projecting optics

Proceedings Article | 20 September 2007 Paper
Proc. SPIE. 6704, Advances in Metrology for X-Ray and EUV Optics II
KEYWORDS: Mirrors, X-ray optics, Metrology, Sensors, Calibration, Ceramics, Temperature sensors, Optical benches, Temperature metrology, Channel projecting optics

Proceedings Article | 20 September 2007 Paper
Proc. SPIE. 6704, Advances in Metrology for X-Ray and EUV Optics II
KEYWORDS: Monochromatic aberrations, Mirrors, Metrology, Error analysis, X-rays, Wavefronts, Computer programming, Ray tracing, Synchrotron radiation, Geometrical optics

Proceedings Article | 20 September 2007 Paper
Proc. SPIE. 6704, Advances in Metrology for X-Ray and EUV Optics II
KEYWORDS: X-ray optics, Cameras, Sensors, Calibration, Image resolution, Photodiodes, CCD cameras, Personal digital assistants, Charge-coupled devices, CCD image sensors

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