Mr. Jonathan Manton
at Inprentus Inc
SPIE Involvement:
Conference Program Committee | Author
Publications (2)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Diffraction gratings, Interferometry, Spectral resolution, Extreme ultraviolet, Metrology, Wavefront sensors, X-ray astronomy, Astronomical imaging, X-ray optics

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII

Conference Committee Involvement (1)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
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