Jonathan Manton
at Inprentus Inc
SPIE Involvement:
Conference Program Committee | Author
Publications (2)

Proceedings Article | 7 September 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: X-ray optics, Metrology, Interferometry, Wavefront sensors, Spectral resolution, Extreme ultraviolet, Astronomical imaging, X-ray astronomy, Diffraction gratings

Proceedings Article | 7 September 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII

Conference Committee Involvement (3)
Advances in Metrology for X-Ray and EUV Optics IX
23 August 2020 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
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