Jonathan P. McCandless
at Air Force Research Lab
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | February 23, 2018
Proc. SPIE. 10533, Oxide-based Materials and Devices IX
KEYWORDS: Thin films, Ellipsometry, Etching, Metals, Silicon, Resistance, Transmission electron microscopy, Wet etching, Zinc oxide, Semiconducting wafers

PROCEEDINGS ARTICLE | February 24, 2017
Proc. SPIE. 10105, Oxide-based Materials and Devices VIII
KEYWORDS: Semiconductors, Oxides, Thin films, Logic, Switches, Silicon, Gallium nitride, Transistors, Integrated circuits, Field effect transistors, Semiconducting wafers, Compound semiconductors

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