Dr. Jonathan Schuster
Electronics Engineer at US Army CCDC
SPIE Involvement:
Area of Expertise:
infrared detectors , physics of semiconductor devices
Profile Summary

Jonathan Schuster received a B.S. degree in physics and a minor in computer science from the University at Buffalo in 2010, a M.S. degree in electrical engineering from Boston University in 2013 and a Ph.D. degree in electrical engineering from Boston University in 2014.

Research interests include modeling fiber optic systems and semiconductor devices. He has extensively modeled infrared photovoltaic pixel arrays incorporating advanced micro-structured characteristics for improved device performance. He is also experienced in developing new hybridization techniques to hybridize pixel arrays to ROICs.
Publications (15)

Proceedings Article | 31 January 2020 Presentation + Paper
Proc. SPIE. 11288, Quantum Sensing and Nano Electronics and Photonics XVII
KEYWORDS: Staring arrays, Interfaces, Diffusion, Quantum efficiency, Photodiodes, Diodes, Gallium, Arsenic, Temperature metrology, Absorption

Proceedings Article | 7 May 2019 Presentation + Paper
Proc. SPIE. 11002, Infrared Technology and Applications XLV
KEYWORDS: Mid-IR, Sensors, Diffusion, Quantum efficiency, Solids, Diodes, Heterojunctions, Superlattices, Temperature metrology, Absorption

Proceedings Article | 9 May 2018 Presentation + Paper
Proc. SPIE. 10624, Infrared Technology and Applications XLIV

Proceedings Article | 23 February 2018 Paper
Proc. SPIE. 10526, Physics and Simulation of Optoelectronic Devices XXVI
KEYWORDS: Infrared imaging, Finite-difference time-domain method, Gaussian beams, Imaging systems, Sensors, Diffusion, Numerical simulations, Computer simulations, 3D modeling, Modulation transfer functions

Proceedings Article | 26 January 2018 Paper
Proc. SPIE. 10540, Quantum Sensing and Nano Electronics and Photonics XV
KEYWORDS: Staring arrays, Long wavelength infrared, Semiconductors, Mercury cadmium telluride, Scattering, Semiconductor materials, Light scattering, Measurement devices, Superlattices, Instrument modeling

Showing 5 of 15 publications
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