Prof. Jonathan B. Scott
at Univ of Waikato
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 December 2007
Proc. SPIE. 6798, Microelectronics: Design, Technology, and Packaging III
KEYWORDS: Semiconductors, Gallium arsenide, Silicon, Reliability, Amplifiers, Gallium nitride, Transistors, Field effect transistors, Silicon carbide, Microwave radiation

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