Dr. Jonathan O. Tollerud
Beamline Scientist at Swinburne Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 December 2010
Proc. SPIE. 7842, Laser-Induced Damage in Optical Materials: 2010
KEYWORDS: Refractive index, Argon, Sputter deposition, Laser induced damage, Optical coatings, Atomic force microscopy, Oxygen, Ion beams, Picosecond phenomena, Scandium

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