Dr. Jong Hyeong Kim Profile

Dr. Jong Hyeong Kim

Professor at Seoul National Univ of Technology

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 25 October 2004 Paper

An automatic inspection of SMT rectangular chips based on PCA algorithm

Kyung Cheol Koh, Kuk Won Ko, Byoung-Wook Choi, Jong Hyeong Kim, Hyung Suck Cho

Proceedings Volume 5603, (2004) https://doi.org/10.1117/12.573592

KEYWORDS: Inspection, Principal component analysis, Calibration, Image processing, Statistical analysis, Optical inspection, Optical character recognition, Manufacturing, Reliability, Detection and tracking algorithms

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Proceedings Article | 25 October 2004 Paper

Development of automatic inspection of defect of compact camera module

Kuk Won Ko, Yu Jin Lee, Beong Wuk Choi, Kyoung Cheol Koh, Jong Hyeong Kim

Proceedings Volume 5603, (2004) https://doi.org/10.1117/12.577570

KEYWORDS: Inspection, CMOS sensors, Algorithm development, Image sensors, Defect inspection, Cameras, Image processing, Defect detection, Calibration, Detection and tracking algorithms

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Proceedings Article | 25 October 2004 Paper

Development of real-time motion capture system for 3D on-line games linked with virtual character

Jong Hyeong Kim, Young Kee Ryu, Hyung Suck Cho

Proceedings Volume 5603, (2004) https://doi.org/10.1117/12.573845

KEYWORDS: Sensors, Infrared sensors, Receivers, Infrared radiation, Computing systems, 3D metrology, Human-computer interaction, Imaging systems, Calibration, Video

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Proceedings Article | 16 September 2003 Paper

Optical nonlinear features and response mechanisms of PtO2 and PdO1.1 masks for optical data storage with superresolution near-field structure

Qian Liu, Toshio Fukaya, Junji Tominaga, Jong Kim, Takashi Kikukawa

Proceedings Volume 5069, (2003) https://doi.org/10.1117/12.532509

KEYWORDS: Nonlinear optics, Near field, Super resolution, Oxides, Optical storage, Near field optics, Metals, Particles, Signal detection, Light scattering

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Conference Committee Involvement (1)

Machine Vision and its Optomechatronic Applications

26 October 2004 | Philadelphia, Pennsylvania, United States

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