Dr. Jong Pil Yun
at Korea Institute of Industrial Technology
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | May 22, 2017
OE Vol. 56 Issue 05
KEYWORDS: Defect inspection, Light sources and illumination, Cameras, Image processing, Defect detection, Optical filters, Switching, Visual optics, Detection and tracking algorithms, Computer simulations

PROCEEDINGS ARTICLE | January 13, 2012
Proc. SPIE. 8350, Fourth International Conference on Machine Vision (ICMV 2011): Computer Vision and Image Analysis; Pattern Recognition and Basic Technologies
KEYWORDS: Defect detection, Detection and tracking algorithms, Cameras, Inspection, Feature extraction, Detector development, Image filtering, Analytical research, Algorithm development, Line scan image sensors

SPIE Journal Paper | March 1, 2009
OE Vol. 48 Issue 03
KEYWORDS: Detection and tracking algorithms, Image segmentation, Algorithm development, Image processing algorithms and systems, Optical engineering, Optical character recognition, Sensors, Edge roughness, Image processing, RGB color model

SPIE Journal Paper | March 1, 2009
OE Vol. 48 Issue 03
KEYWORDS: Defect detection, Detection and tracking algorithms, Inspection, Wavelet transforms, Image segmentation, Wavelets, Linear filtering, Optical engineering, Manufacturing, Image processing

SPIE Journal Paper | July 1, 2008
OE Vol. 47 Issue 07
KEYWORDS: Defect detection, Image segmentation, Detection and tracking algorithms, Image filtering, Digital filtering, Defect inspection, Image processing, Optical filters, Gaussian filters, Digital signal processing

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